计算机应用 ›› 2012, Vol. 32 ›› Issue (04): 1152-1156.DOI: 10.3724/SP.J.1087.2012.01152

• 典型应用 • 上一篇    下一篇

基于Markov链的嵌入式系统硬件可靠性研究

郭荣佐1,黄君2,王霖3   

  1. 1. 四川师范大学 计算机科学学院, 成都 610068
    2. 四川工商职业技术学院 基础部,四川 都江堰 611830
    3. 成都纺织高等专科学校 电子信息与电气工程系,成都 611731
  • 收稿日期:2011-11-01 修回日期:2011-12-15 发布日期:2012-04-20 出版日期:2012-04-01
  • 通讯作者: 郭荣佐
  • 作者简介:郭荣佐(1973-),男,四川开江人,副教授,主要研究方向:嵌入式系统、实时控制系统、物联网感知;黄君(1974-),女,重庆丰都人,讲师,硕士,主要研究方向:应用数学;王霖(1970-),男,四川遂宁人,副教授,主要研究方向:计算机网络。
  • 基金资助:
    四川省教育厅自然科学基金重点项目

Hardware reliability study of embedded system based on Markov chain

GUO Rong-zuo1,HUANG Jun2,WANG Lin3   

  1. 1. College of Computer Science, Sichuan Normal University, Chengdu Sichuan 610068, China
    2. Department of Grounding Instruction, Sichuan Technology and Business College, Dujiangyan Sichuan 611830, China
    3. Department of Electronic Information and Electrical Engineering, Chengdu Textile College, Chengdu Sichuan 611731 ,China
  • Received:2011-11-01 Revised:2011-12-15 Online:2012-04-20 Published:2012-04-01
  • Contact: GUO Rong-zuo

摘要: 嵌入式系统产品在使用过程中经常出现硬件故障,从而影响系统的安全可靠性。从嵌入式系统硬件层面研究其可靠性。首先定义嵌入式系统硬件目标,简单介绍了Markov过程理论;建立了单个IP硬核和嵌入式系统硬件的Markov模型;应用所建立的模型,对嵌入式站间自动闭塞控制器硬件进行了可靠度计算和分析。实验结果表明,该Markov模型能够准确描述嵌入式系统硬件的状态变迁,并能计算和分析其可靠度,具有一定的实用价值。

关键词: 可靠性, 硬件, 嵌入式系统, Markov链, 站间自动闭塞

Abstract: The products of embedded system often have hardware failure while in use, which affects the safety and reliability of the system. In this paper, its reliability was researched from the embedded system hardware level. At first, it defined the goal of the embedded system hardware, and introduced the theory of Markov process. And then, a single IP hardcore and embedded system hardware Markov model was set up. At last, the reliability of the embedded controller hardware automatic block was calculated and analyzed through the established model. The results show that the Markov model can accurately describe the embedded system hardware state change, and can calculate and analyze their reliability. Therefore, the model has certain practical value.

Key words: reliability, hardware, embedded system, Markov chain, inter-station automatic block