[1]CHEN L F, SU C T, CHEN M H. A neural-network approach for defect recognition in TFT-LCD photolithography process [J]. IEEE Transactions on Electronics Packaging Manufacturing, 2009, 32(1): 1-8.[2]AJAY K. Computer-vision-based fabric defect detection: a survey [J]. IEEE Transactions on Industrial Electronics, 2008, 55(1): 348-363.[3]YANG X, PANG G, YUNG N. Robust fabric defect detection and classification using multiple adaptive wavelets [J]. IEE Proceedings on Vision, Image and Signal Processing, 2005, 152(6):715-723.[4]LIU H X, ZHOU W, KUANG Q W, et al. Defect detection of IC wafer based on spectral subtraction [J]. IEEE Transactions on Semiconductor Manufacturing, 2010, 23(1): 141-147.[5]OLIVEIRA H, CORREIA P L. Automatic road crack detection and characterization [J]. IEEE Transactions on Intelligent Transportation Systems, 2013, 14(1): 155-168.[6]TSAI D M, WU S C, CHIU W Y. Defect detection in solar modules using ICA basis images [J]. IEEE Transactions on Industrial Informatics, 2013, 9(1): 122-131.[7]王磊.基于机器视觉的电池表面缺陷检测技术研究[D].合肥:中国科学技术大学,2011.[8]张舞杰,李迪,叶峰.硅太阳能电池纹理缺陷检测[J].计算机应用,2010,30(10):2702-2704.[9]柳效辉,徐林,肖晨江,等.基于Matlab的图像处理技术识别硅太阳电池的缺陷[J].上海交通大学学报,2010,44(7):926-930.[10]张宏军,刘堂友.结合PCA和SVM的太阳能电池缺陷识别[J].电视技术,2011,35(21):66-68.[11]JIA J Y. Single image motion deblurring using transparency [C]// CVPR'07: Proceedings of 2007 IEEE Conference on Computer Vision and Pattern Recognition. Piscataway: IEEE Press, 2007: 1-8.[12]DAI S Y, WU Y. Motion from blur [C]// CVPR 2008: Proceedings of 2008 IEEE Conference on Computer Vision and Pattern Recognition. Piscataway: IEEE Press, 2008: 1-8.[13]TAI Y W, HAO D, BROWN M S, et al. Image/video deblurring using a hybrid camera [EB/OL]. [2012-12-20]. http://research.microsoft.com/en-us/UM/people/stevelin/papers/cvpr08tai.pdf.[14]LE M H, WOO B S, JO K H. A comparison of SIFT and Harris conner features for correspondence points matching [C]// Proceedings of 2011 17th Korea-Japan Joint Workshop on Frontiers of Computer Vision. Piscataway: IEEE Press, 2011: 1-4. |