Defect analysis model of Bayesian and its application in software testing
HU Yu-peng1,CHEN Zhi-ping1,2,LIN Ya-ping1,LI Jun-yi1
1.Software College,Hunan University,Changsha Hunan 410082,China; 2.Department of Computer and Information Science,Fujian University of Technology,Fuzhou Fujian 350014,China
HU Yu-peng,CHEN Zhi-ping,LIN Ya-ping,LI Jun-yi. Defect analysis model of Bayesian and its application in software testing[J]. Journal of Computer Applications, 2005, 25(04): 808-810.