×
模态框（Modal）标题
在这里添加一些文本
Close
Close
Submit
Cancel
Confirm
×
模态框（Modal）标题
在这里添加一些文本
Close
Toggle navigation
Home
About
About Journal
Historical Evolution
Indexed In
Awards
Reference Index
Editorial Board
Journal Online
Archive
Project Articles
Most Download Articles
Most Read Articles
Instruction
Contribution Column
Author Guidelines
Template
FAQ
Copyright Agreement
Expenses
Academic Integrity
Contact
Contact Us
Location Map
Subscription
Advertisement
中文
Industrial defect detection method with improved masked autoencoder
Kaili DENG, Weibo WEI, Zhenkuan PAN
Journal of Computer Applications . 2024, (
8
): 2595 -2603 . DOI: 10.11772/j.issn.1001-9081.2023081122
