Efficient Blob analysis of binary image for defects inspection in optical films
HU Guang-hua1,2
1.School of Mechanical and Automotive Engineering, South China University of Technology, Guangzhou Guangdong 510641, China
2.Guangzhou Nansha Huazhuo Chemicals Corporation Limited, Guangzhou Guangdong 511458, China
HU Guang-hua. Efficient Blob analysis of binary image for defects inspection in optical films[J]. Journal of Computer Applications, 2011, 31(10): 2767-2769.