Reconfigurable test scheme for 3D stacked integrated circuits based on 3D linear feedback shift register
Tian CHEN, Jianyong LU, Jun LIU, Huaguo LIANG, Yingchun LU
Journal of Computer Applications . 2023, (3): 949 -955 .  DOI: 10.11772/j.issn.1001-9081.2022020186

Copyright © 2021 Sichuan Computer Applications Press Co., Ltd.
蜀ICP备 05010208 号　新出网证(川)字026号
Powered by Beijing Magtech Co., Ltd.
Total visits:
Today visits: