面向光学薄膜瑕疵检测的二值图像快速Blob分析算法

胡广华

Efficient Blob analysis of binary image for defects inspection in optical films

HU Guang-hua

计算机应用 . 2011, (10): 2767 -2769 . DOI: 10.3724/SP.J.1087.2011.02767