计算机应用 ›› 2017, Vol. 37 ›› Issue (4): 936-940.DOI: 10.11772/j.issn.1001-9081.2017.04.0936

• 大数据与云计算及其应用 • 上一篇    下一篇

基于多斜率码链的阵列纠删码

唐聃, 杨昊澎, 王福超   

  1. 成都信息工程大学 软件工程学院, 成都 610225
  • 收稿日期:2016-10-08 修回日期:2016-11-25 出版日期:2017-04-10 发布日期:2017-04-19
  • 通讯作者: 唐聃
  • 作者简介:唐聃(1982-),男,四川成都人,副教授,博士,CCF会员,主要研究方向:大数据、云计算、编码理论。
  • 基金资助:
    国家自然科学基金资助项目(61501064,61501063);四川省青年科技基金资助项目(2017JQ0057)。

Array erasure codes based on coding chains with multiple slopes

TANG Dan, YANG Haopeng, WANG Fuchao   

  1. College of Software Engineering, Chengdu University of Information Technology, Chengdu Sichuan 610225, China
  • Received:2016-10-08 Revised:2016-11-25 Online:2017-04-10 Published:2017-04-19
  • Supported by:
    This work is partially supported by the National Natural Science Foundation of China (61501064, 61501063), the Youth Science and Technology Fund of Sichuan Province (2017JQ0057).

摘要: 针对当前大多阵列纠删码容错能力偏低以及构造时需要满足的约束条件较强的问题,提出一类基于码链构造的阵列纠删码。该阵列纠删码使用不同斜率码链组织数据元素和校验元素间的关系,从而能达到理论上不受限制的容错能力;而在构造时避开了类似素数约束的强约束条件,易于实用和扩展。仿真实验结果表明,相对于RS(Reed-Solomon)码,基于多斜率码链阵列纠删码在运算效率上的提升超过了2个数量级;在固定的容错能力下,存储效率能随着条块尺寸的增加而提高。此外,该类阵列码的修复代价和更新代价为一个固定常量,不会随着系统规模的扩大或容错能力的提高而增加。

关键词: 阵列纠删码, 容错, 码链, 条块尺寸

Abstract: In view of the problem that the fault tolerance capability is low and strong constraint conditions need to be satisfied in the construction of most array erasure codes at present, a new type of array erasure codes based on coding chains was proposed. In the new array erasure codes, coding chains with different slopes were used to organize the relationship among data elements and check elements, so as to achieve infinite fault tolerance capability in theory; the strong constraint conditions like the prime number limitation was avoided in construction, which is easy to be practical and extensible. Simulation results show that, compared with Reed-Solomon codes (RS codes), the efficiency of the proposed array erasure codes based on coding chains is more than 2 orders of magnitude; under the condition of fixed fault tolerance, its storage efficiency can be improved with the increase of the strip size. In addition, the update penalty and repair cost of the array codes is a fixed constant, which will not increase with the expansion of the storage system scale or the increase of fault tolerance capability.

Key words: array erasure code, fault tolerance, coding chain, strip size

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