基于三态信号的测试数据相容压缩方法

doi:10.11772/j.issn.1001-9081.2018112334

计算机应用 ›› 2019, Vol. 39 ›› Issue (6): 1863-1868.DOI: 10.11772/j.issn.1001-9081.2018112334

• 应用前沿、交叉与综合 • 上一篇

基于三态信号的测试数据相容压缩方法

陈田^1,2, 左永生^1,2, 安鑫^1,2, 任福继^1,2,3

1. 合肥工业大学计算机与信息学院, 合肥 230601;
2. 情感计算与先进智能机器安徽省重点实验室(合肥工业大学), 合肥 230601;
3. 德岛大学工学部, 日本德岛 770-8506

收稿日期:2018-11-26 修回日期:2019-01-08 发布日期:2019-06-17 出版日期:2019-06-10
通讯作者: 陈田
作者简介:陈田(1974-),女,安徽合肥人,副教授,博士,CCF高级会员,主要研究方向:超大规模集成电路/系统芯片低功耗测试、可测试性设计、可穿戴计算;左永生(1995-),男,安徽六安人,硕士研究生,主要研究方向:超大规模集成电路/系统芯片低功耗测试、可测试性设计;安鑫(1987-),男,山东潍坊人,副教授,博士,CCF会员,主要研究方向:嵌入式系统、基于可编程逻辑门阵列的动态重构架构;任福继(1959-),男,四川南充人,教授,博士,主要研究方向:情感计算、智能机器人。
基金资助:
国家自然科学基金资助项目（61474035，61204046，61502140，61432004）。

Test data compatible compression method based on tri-state signal

CHEN Tian^1,2, ZUO Yongsheng^1,2, AN Xin^1,2, REN Fuji^1,2,3

1. School of Computer Science and Information Engineering, Hefei University of Technology, Hefei Anhui 230601, China;
2. Anhui Provincial Key Laboratory of Affective Computing and Advanced Intelligent Machine(Hefei University of Technology), Hefei Anhui 230601, China;
3. Faculty of Engineering, The University of Tokushima, Tokushima 770-8506, Japan

Received:2018-11-26 Revised:2019-01-08 Online:2019-06-17 Published:2019-06-10
Supported by:
This work is partially supported by the National Natural Science Foundation of China (61474035, 61204046, 61502140, 61432004).

摘要/Abstract

摘要： 针对超大规模集成电路（VLSL）的发展过程中测试数据量增加的问题，提出了一种基于三态信号的测试数据压缩方法。首先，对测试集进行优化预处理操作，即对测试集进行部分输入精简和测试向量重排序操作，在提高测试集中无关位X的比例的同时，使各测试向量之间的相容性提高；随后，对预处理后的测试集进行三态信号编码压缩，即利用三态信号的特性将测试集划分为多个扫描切片，并对扫描切片进行相容编码压缩，考虑多种相容规则使得测试集的压缩率得到提高。实验结果表明，与同类压缩方法相比，所提的方法取得了较高的压缩率，平均测试压缩率达到76.17%，同时测试功耗和面积开销也没有明显增加。

关键词: 测试数据压缩, 三态信号, 相容压缩, 扫描切片, 自动测试设备

Abstract: Focusing on the increasing amount of test data in the development of Very Large Scale Integration (VLSI), a test data compression method based on tri-state signal was proposed. Firstly, the test set was optimized and pre-processed by performing partial input reduction and test vector reordering operations, improving the compatibility among test patterns while increasing the proportion of don't-care bit X in the test set. Then, the coding compression of tri-state signal was performed to the pre-processed test set, so that the test set was divided into multiple scan slices by using the characteristics of tri-state signal, and the tri-state signal was used to perform compatible coding compression on the scann slices. With various test rules considered, the test set compression ratio was improved. The experimental results show that, compared with the similar compression methods, the proposed method achieves a higher compression ratio, and the average test compression ratio reaches 76.17% without significant increase of test power and area overhead.

Key words: test data compression, tri-state signal, compatible compression, scan slice, Automatic Test Equipment (ATE)

中图分类号:

TP391. 7

陈田, 左永生, 安鑫, 任福继. 基于三态信号的测试数据相容压缩方法[J]. 计算机应用, 2019, 39(6): 1863-1868.

CHEN Tian, ZUO Yongsheng, AN Xin, REN Fuji. Test data compatible compression method based on tri-state signal[J]. Journal of Computer Applications, 2019, 39(6): 1863-1868.

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基于三态信号的测试数据相容压缩方法

Test data compatible compression method based on tri-state signal

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